Listar por autor "Wielunski, Leszek S."

Mostrando ítems 1-1 de 1

Optical band gaps and composition dependence of hafnium–aluminate thin films grown by atomic layer chemical vapor deposition

Nguyen, N. V.; Sayan, S.; Levin, Igor; Ehrstein, James R.; Baumvol, Israel Jacob Rabin; Driemeier, Carlos Eduardo; Krug, Cristiano; Wielunski, Leszek S.; Hung, Puiyee Y.; Diebold, Alain (2005) [Artículo de periódico]

We report the optical properties of unannealed hafnium–aluminate HfAlO films grown by atomic layer chemical vapor deposition ALCVD and correlate them with the aluminum contents in the films. Vacuum ultraviolet spectroscopic ...