• Characterization of nanoparticles through medium-energy ion scattering 

      Sortica, Maurício de Albuquerque; Grande, Pedro Luis; Machado, Giovanna; Miotti, Leonardo (2009) [Artigo de periódico]
      In this work we review the use of the medium-energy ion scattering (MEIS) technique to characterize nanostructures at the surface of a substrate. We discuss here how the determination of shape and size distribution of the ...
    • Limiting step involved in the thermal growth of silicon oxide films on silicon carbide 

      Vickridge, Ian; Trimaille, Isabelle; Ganem, Jean-Jacques; Rigo, Serge; Radtke, Claudio; Baumvol, Israel Jacob Rabin; Stedile, Fernanda Chiarello (2002) [Artigo de periódico]
      Thermal growth of silicon oxide films on silicon carbide in O2 was investigated using oxygen isotopic substitution and narrow resonance nuclear reaction profiling. This investigation was carried out in parallel with the ...
    • Reaction-diffusion model for thermal growth of silicon nitride films on Si 

      Almeida, Rita Maria Cunha de; Baumvol, Israel Jacob Rabin (2000) [Artigo de periódico]
      Thermal growth of ultrathin silicon nitride films on Si in NH₃ is modeled as a dynamic system governed by reaction-diffusion equations. Solution of the model yields profiles of the involved species consistent with experimental ...