Experimental and analytical study of xeon phi reliability
dc.contributor.author | Oliveira, Daniel Alfonso Gonçalves de | pt_BR |
dc.contributor.author | Pilla, Laercio Lima | pt_BR |
dc.contributor.author | DeBardeleben, Nathan | pt_BR |
dc.contributor.author | Blanchard, Sean | pt_BR |
dc.contributor.author | Quinn, Heather | pt_BR |
dc.contributor.author | Koren, Israel | pt_BR |
dc.contributor.author | Navaux, Philippe Olivier Alexandre | pt_BR |
dc.contributor.author | Rech, Paolo | pt_BR |
dc.date.accessioned | 2018-01-13T02:24:44Z | pt_BR |
dc.date.issued | 2017 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/171994 | pt_BR |
dc.format.mimetype | application/pdf | pt_BR |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | ACM International Conference for High Performance Computing, Networking, Storage and Analysis, SUPERCOMPUTING ( 2017 Nov. 12-17 : Denver, Colorado). Proceedings. New York : ACM, c2017 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Radiation experiments | en |
dc.subject | Tolerancia : Falhas | pt_BR |
dc.subject | Processamento paralelo | pt_BR |
dc.subject | Fault injection | en |
dc.subject | Parallel architectures | en |
dc.subject | Fault tolerance | en |
dc.subject | Reliability | en |
dc.title | Experimental and analytical study of xeon phi reliability | pt_BR |
dc.type | Trabalho completo publicado em evento | pt_BR |
dc.identifier.nrb | 001058179 | pt_BR |
dc.type.origin | Estrangeiro | pt_BR |
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