Growth kinetics of solid-state-reacted fe-zr multilayer films

dc.contributor.author	Paesano Junior, Andrea	pt_BR
dc.contributor.author	Teixeira, Sergio Ribeiro	pt_BR
dc.contributor.author	Amaral, Livio	pt_BR
dc.date.accessioned	2014-05-17T02:06:49Z	pt_BR
dc.date.issued	1991	pt_BR
dc.identifier.issn	0021-8979	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/95349	pt_BR
dc.description.abstract	Multilayers of Fee0.33Zr0.67, prepared by electron beam evaporation, have been characterized by conversion electron Mijssbauer spectroscopy, Rutherford backscattering spectroscopy, and x-ray diffraction. Two phases, one amorphous and another crystalline (FeZr3), occur by solid-state reaction. For temperatures of 350 and 500 °C and annealing times ranging from 10 min to 72 h the growth rates of both phases had been obtained. From these results we suggest a model to describe the phase growth kinetics of the amorphouscrystalline Fe0.33Zr0.67 multilayer thin film.	en
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	Journal of Applied Physics. Woodbury. Vol. 70, n. 9 (Nov. 1991), p. 4870-4876	pt_BR
dc.rights	Open Access	en
dc.subject	Implantação de íons	pt_BR
dc.subject	Efeito mossbauer	pt_BR
dc.subject	Retroespalhamento rutherford	pt_BR
dc.subject	Raios X	pt_BR
dc.subject	Filmes finos	pt_BR
dc.title	Growth kinetics of solid-state-reacted fe-zr multilayer films	pt_BR
dc.type	Artigo de periódico	pt_BR
dc.identifier.nrb	000055570	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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